Temperature Test Equipment for DIP-Inspection
PTT-300
Crystal Device Manufacturing
Temperature Test selling agency
Overview
This device inspects the temperature measurement of the SMD-type crystal oscillator. DIP inspection of temperature test is possible by continuously changing the temperature from-30°C to +85°C.
Features
- This equipment adopts a Peltier element for temperature control, and high-precision temperature measurement test is possible by placing an SMD type crystal oscillator on a plate controlled by a Peltier element. In addition, by controlling the temperature in the range of-30 to +85°C in 0.5°C temperature steps, DIP inspection of accurate temperature characteristics is possible.
- Multiple simultaneous measurements realized a high throughput.
- With the loader and unloader, it is fully automatic from supply to classification and storage.
- This temperature inspection equipment is ideal for development, quality assurance, prototype production, and small-lot production.
Usage examples
- This device inspects the temperature measurement of the SMD-type crystal oscillator.
- DIP inspection of temperature measurement is possible by continuously changing the temperature from-30°C to +85°C.
Optional
- Device inspects temperature measurement for SMD type crystal units
- Compatible with multiple types of jigs than exclusive use jig replacement
Product Specifications
| ITEM | DETAILS |
|---|---|
| Target workpiece | SMD type crystal oscillator *Can be optionally supported with SMD type crystal oscillator |
| Target workpiece size | 5.0 x 3.2 to 1.6 x 1.2 (mm) * Work size is negotiable |
| Temperature range | -30°C to +85°C *Consult with CKD regarding temperature range |
| Temperature control time (approximate) | +25°C ⇒-30°C for about 5 minutes,-30°C ⇒ +85°C for about 10 minutes, +85°C ⇒ +25°C for about 5 minutes |
| Stylus block | Probe type : 2 sets (Temperature control plate 1, Temperature control plate 2: 1 set each) |
| Measuring instrument | Frequency counter + power supply |
| Temperature control system | Peltier element + chiller unit |
| Temperature control plate | Dedicated tray of about 80 pieces |
| Work supply | Supplied from the stacking tray and transferred to the temperature control plate (special tray) |
| External Dimensions | Main unit: W1200×D800×H1500 mm (excluding protruding objects such as measuring instruments and patlites) Chiller: W340×D384×H851 mm×4 sets (for temperature control plate) |
| Option | Suitable for SMD-type crystal resonators. Multiple size models are available with switching parts. |
※ Please note that the appearance and some of the specifications are subject to change for performance improvement.
